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scheduling daily short and monthly long tests via smartd.conf
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# DEVICESCAN | |
/dev/da0 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da1 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da2 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da3 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da4 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da5 -a -d scsi -m dan@langille.org -s S/../.././22 | |
/dev/da0 -a -d scsi -m dan@langille.org -s L/../28/./23 | |
/dev/da1 -a -d scsi -m dan@langille.org -s L/../01/./01 | |
/dev/da2 -a -d scsi -m dan@langille.org -s L/../02/./01 | |
/dev/da3 -a -d scsi -m dan@langille.org -s L/../03/./01 | |
/dev/da4 -a -d scsi -m dan@langille.org -s L/../04/./01 | |
/dev/da5 -a -d scsi -m dan@langille.org -s L/../04/./01 |
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[dan@r710-01:/var/log] $ sudo smartd -q showtests | |
smartd 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build) | |
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org | |
Opened configuration file /usr/local/etc/smartd.conf | |
Configuration file /usr/local/etc/smartd.conf parsed. | |
Device: /dev/da0, opened | |
Device: /dev/da0, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628fc2, S/N: S3PTNF0JA70588A, 500 GB | |
Device: /dev/da0, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da1, opened | |
Device: /dev/da1, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d425340fc, S/N: S3PTNF0JA11513Y, 500 GB | |
Device: /dev/da1, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da2, opened | |
Device: /dev/da2, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d426290fc, S/N: S3PTNF0JA70742A, 500 GB | |
Device: /dev/da2, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da3, opened | |
Device: /dev/da3, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628bea, S/N: S3PTNF0JA70159T, 500 GB | |
Device: /dev/da3, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da4, opened | |
Device: /dev/da4, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a37e497a7, S/N: 133887400871, 32.0 GB | |
Device: /dev/da4, does not support SMART Self-Test Log. | |
Device: /dev/da4, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da5, opened | |
Device: /dev/da5, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a44f24963, S/N: 134106402147, 32.0 GB | |
Device: /dev/da5, does not support SMART Self-Test Log. | |
Device: /dev/da5, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da0, opened | |
Device: /dev/da0, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628fc2, S/N: S3PTNF0JA70588A, 500 GB | |
Device: /dev/da0, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da1, opened | |
Device: /dev/da1, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d425340fc, S/N: S3PTNF0JA11513Y, 500 GB | |
Device: /dev/da1, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da2, opened | |
Device: /dev/da2, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d426290fc, S/N: S3PTNF0JA70742A, 500 GB | |
Device: /dev/da2, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da3, opened | |
Device: /dev/da3, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628bea, S/N: S3PTNF0JA70159T, 500 GB | |
Device: /dev/da3, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da4, opened | |
Device: /dev/da4, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a37e497a7, S/N: 133887400871, 32.0 GB | |
Device: /dev/da4, does not support SMART Self-Test Log. | |
Device: /dev/da4, is SMART capable. Adding to "monitor" list. | |
Device: /dev/da5, opened | |
Device: /dev/da5, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a44f24963, S/N: 134106402147, 32.0 GB | |
Device: /dev/da5, does not support SMART Self-Test Log. | |
Device: /dev/da5, is SMART capable. Adding to "monitor" list. | |
Monitoring 0 ATA/SATA, 12 SCSI/SAS and 0 NVMe devices | |
Next scheduled self tests (at most 5 of each type per device): | |
Device: /dev/da0, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da1, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da2, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da3, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da4, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da5, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da0, will do test 1 of type L at Sun Oct 28 23:27:36 2018 UTC | |
Device: /dev/da0, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da1, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da2, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da3, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da4, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da5, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC | |
Device: /dev/da0, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da1, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da2, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da3, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da4, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da5, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC | |
Device: /dev/da0, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da1, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da2, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da3, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da4, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da5, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC | |
Device: /dev/da1, will do test 1 of type L at Thu Nov 1 01:27:36 2018 UTC | |
Device: /dev/da0, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da1, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da2, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da3, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da4, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da5, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC | |
Device: /dev/da2, will do test 1 of type L at Fri Nov 2 01:27:36 2018 UTC | |
Device: /dev/da3, will do test 1 of type L at Sat Nov 3 01:27:36 2018 UTC | |
Device: /dev/da4, will do test 1 of type L at Sun Nov 4 01:27:36 2018 UTC | |
Device: /dev/da5, will do test 1 of type L at Sun Nov 4 01:27:36 2018 UTC | |
Device: /dev/da0, will do test 2 of type L at Wed Nov 28 23:27:36 2018 UTC | |
Device: /dev/da1, will do test 2 of type L at Sat Dec 1 01:27:36 2018 UTC | |
Device: /dev/da2, will do test 2 of type L at Sun Dec 2 01:27:36 2018 UTC | |
Device: /dev/da3, will do test 2 of type L at Mon Dec 3 01:27:36 2018 UTC | |
Device: /dev/da4, will do test 2 of type L at Tue Dec 4 01:27:36 2018 UTC | |
Device: /dev/da5, will do test 2 of type L at Tue Dec 4 01:27:36 2018 UTC | |
Device: /dev/da0, will do test 3 of type L at Fri Dec 28 23:27:36 2018 UTC | |
Device: /dev/da1, will do test 3 of type L at Tue Jan 1 01:27:36 2019 UTC | |
Device: /dev/da2, will do test 3 of type L at Wed Jan 2 01:27:36 2019 UTC | |
Device: /dev/da3, will do test 3 of type L at Thu Jan 3 01:27:36 2019 UTC | |
Device: /dev/da4, will do test 3 of type L at Fri Jan 4 01:27:36 2019 UTC | |
Device: /dev/da5, will do test 3 of type L at Fri Jan 4 01:27:36 2019 UTC | |
Totals [Sun Oct 28 22:57:36 2018 UTC - Sat Jan 26 22:57:36 2019 UTC]: | |
Device: /dev/da0, will do 0 tests of type L | |
Device: /dev/da0, will do 91 tests of type S | |
Device: /dev/da1, will do 0 tests of type L | |
Device: /dev/da1, will do 91 tests of type S | |
Device: /dev/da2, will do 0 tests of type L | |
Device: /dev/da2, will do 91 tests of type S | |
Device: /dev/da3, will do 0 tests of type L | |
Device: /dev/da3, will do 91 tests of type S | |
Device: /dev/da4, will do 0 tests of type L | |
Device: /dev/da4, will do 91 tests of type S | |
Device: /dev/da5, will do 0 tests of type L | |
Device: /dev/da5, will do 91 tests of type S | |
Device: /dev/da0, will do 3 tests of type L | |
Device: /dev/da0, will do 0 tests of type S | |
Device: /dev/da1, will do 3 tests of type L | |
Device: /dev/da1, will do 0 tests of type S | |
Device: /dev/da2, will do 3 tests of type L | |
Device: /dev/da2, will do 0 tests of type S | |
Device: /dev/da3, will do 3 tests of type L | |
Device: /dev/da3, will do 0 tests of type S | |
Device: /dev/da4, will do 3 tests of type L | |
Device: /dev/da4, will do 0 tests of type S | |
Device: /dev/da5, will do 3 tests of type L | |
Device: /dev/da5, will do 0 tests of type S | |
[dan@r710-01:/var/log] $ |
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[dan@knew:~] $ cat /var/log/messages | |
Oct 29 00:00:00 knew newsyslog[4405]: logfile turned over | |
Oct 29 00:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 00:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 01:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 01:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 02:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 02:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 03:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 03:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 8 Offline uncorrectable sectors | |
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], previous self-test completed with error (read test element) | |
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], Self-Test Log error count increased from 0 to 1 | |
Oct 29 04:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors | |
Oct 29 04:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 8 Offline uncorrectable sectors |
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SMART Self-test log structure revision number 1 | |
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error | |
# 1 Extended offline Completed: read failure 00% 23183 94063856 | |
# 2 Short offline Completed without error 00% 23173 - | |
# 3 Extended offline Interrupted (host reset) 90% 23104 - | |
# 4 Short offline Completed without error 00% 23104 - | |
# 5 Extended offline Completed without error 00% 13865 - | |
# 6 Short offline Completed without error 00% 13857 - |
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# start where we failed (see line 3 in previous section | |
sudo smartctl -t select,94063856-94063866 /dev/da7 | |
# start a few spots earlier: | |
sudo smartctl -t select,94063850-94063866 /dev/da7 | |
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[dan@knew:~] $ sudo smartctl -a /dev/da7 | |
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build) | |
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org | |
=== START OF INFORMATION SECTION === | |
Model Family: Toshiba 3.5" MD04ACA... Enterprise HDD | |
Device Model: TOSHIBA MD04ACA500 | |
Serial Number: 653DK7WAFS9A | |
LU WWN Device Id: 5 000039 65bd0049b | |
Firmware Version: FP2A | |
User Capacity: 5,000,981,078,016 bytes [5.00 TB] | |
Sector Sizes: 512 bytes logical, 4096 bytes physical | |
Rotation Rate: 7200 rpm | |
Form Factor: 3.5 inches | |
Device is: In smartctl database [for details use: -P show] | |
ATA Version is: ATA8-ACS (minor revision not indicated) | |
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) | |
Local Time is: Mon Oct 29 12:36:47 2018 UTC | |
SMART support is: Available - device has SMART capability. | |
SMART support is: Enabled | |
=== START OF READ SMART DATA SECTION === | |
SMART overall-health self-assessment test result: PASSED | |
General SMART Values: | |
Offline data collection status: (0x85) Offline data collection activity | |
was aborted by an interrupting command from host. | |
Auto Offline Data Collection: Enabled. | |
Self-test execution status: ( 249) Self-test routine in progress... | |
90% of test remaining. | |
Total time to complete Offline | |
data collection: ( 120) seconds. | |
Offline data collection | |
capabilities: (0x5b) SMART execute Offline immediate. | |
Auto Offline data collection on/off support. | |
Suspend Offline collection upon new | |
command. | |
Offline surface scan supported. | |
Self-test supported. | |
No Conveyance Self-test supported. | |
Selective Self-test supported. | |
SMART capabilities: (0x0003) Saves SMART data before entering | |
power-saving mode. | |
Supports SMART auto save timer. | |
Error logging capability: (0x01) Error logging supported. | |
General Purpose Logging supported. | |
Short self-test routine | |
recommended polling time: ( 2) minutes. | |
Extended self-test routine | |
recommended polling time: ( 538) minutes. | |
SCT capabilities: (0x003d) SCT Status supported. | |
SCT Error Recovery Control supported. | |
SCT Feature Control supported. | |
SCT Data Table supported. | |
SMART Attributes Data Structure revision number: 16 | |
Vendor Specific SMART Attributes with Thresholds: | |
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE | |
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 | |
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 | |
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 9263 | |
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 59 | |
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 | |
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 | |
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 | |
9 Power_On_Hours 0x0032 043 043 000 Old_age Always - 23191 | |
10 Spin_Retry_Count 0x0033 101 100 030 Pre-fail Always - 0 | |
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59 | |
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 36 | |
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54 | |
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 458 | |
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 18/52) | |
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 | |
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 64 | |
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 8 | |
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0 | |
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0 | |
222 Loaded_Hours 0x0032 043 043 000 Old_age Always - 23060 | |
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 | |
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 | |
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 207 | |
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0 | |
SMART Error Log Version: 1 | |
ATA Error Count: 14 (device log contains only the most recent five errors) | |
CR = Command Register [HEX] | |
FR = Features Register [HEX] | |
SC = Sector Count Register [HEX] | |
SN = Sector Number Register [HEX] | |
CL = Cylinder Low Register [HEX] | |
CH = Cylinder High Register [HEX] | |
DH = Device/Head Register [HEX] | |
DC = Device Command Register [HEX] | |
ER = Error register [HEX] | |
ST = Status register [HEX] | |
Powered_Up_Time is measured from power on, and printed as | |
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, | |
SS=sec, and sss=millisec. It "wraps" after 49.710 days. | |
Error 14 occurred at disk power-on lifetime: 20163 hours (840 days + 3 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 08 08 93 9e 40 Error: UNC at LBA = 0x009e9308 = 10392328 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 00 00 28 93 9e 40 00 7d+06:21:40.730 READ FPDMA QUEUED | |
60 00 08 28 92 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED | |
60 00 00 28 91 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED | |
60 00 08 28 90 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED | |
60 00 00 28 8f 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED | |
Error 13 occurred at disk power-on lifetime: 20162 hours (840 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 08 f8 4c 9b 40 Error: UNC at LBA = 0x009b4cf8 = 10177784 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 68 00 a8 52 9b 40 00 7d+05:43:57.481 READ FPDMA QUEUED | |
60 c8 08 b0 4c 9b 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 58 00 88 b8 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 c0 08 c8 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 c8 00 00 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
Error 12 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 20 40 9b 40 Error: UNC at LBA = 0x009b4020 = 10174496 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 10 20 38 52 19 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 10 18 38 50 19 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 10 10 38 02 00 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 50 08 f0 65 9b 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 80 00 20 40 9b 40 00 05:34:34.941 READ FPDMA QUEUED | |
Error 11 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 e0 3f 9b 40 Error: UNC at LBA = 0x009b3fe0 = 10174432 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 80 08 20 40 9b 40 00 05:34:30.719 READ FPDMA QUEUED | |
60 00 00 20 3f 9b 40 00 05:34:30.719 READ FPDMA QUEUED | |
60 98 00 38 1f 9b 40 00 05:34:30.714 READ FPDMA QUEUED | |
60 00 08 38 1e 9b 40 00 05:34:30.714 READ FPDMA QUEUED | |
60 00 00 20 b2 9a 40 00 05:34:30.714 READ FPDMA QUEUED | |
Error 10 occurred at disk power-on lifetime: 19940 hours (830 days + 20 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 d0 26 9b 40 Error: WP at LBA = 0x009b26d0 = 10168016 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
61 08 20 38 a4 ae 40 00 47d+16:04:36.001 WRITE FPDMA QUEUED | |
60 10 18 38 52 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 10 10 38 50 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 10 08 38 02 00 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 20 00 c8 26 9b 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
SMART Self-test log structure revision number 1 | |
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error | |
# 1 Selective offline Completed: read failure 00% 23191 94063856 | |
# 2 Extended offline Completed: read failure 00% 23183 94063856 | |
# 3 Short offline Completed without error 00% 23173 - | |
# 4 Extended offline Interrupted (host reset) 90% 23104 - | |
# 5 Short offline Completed without error 00% 23104 - | |
# 6 Extended offline Completed without error 00% 13865 - | |
# 7 Short offline Completed without error 00% 13857 - | |
SMART Selective self-test log data structure revision number 1 | |
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS | |
1 94063850 94063866 Self_test_in_progress [90% left] (94044160-94109695) | |
2 0 0 Not_testing | |
3 0 0 Not_testing | |
4 0 0 Not_testing | |
5 0 0 Not_testing | |
Selective self-test flags (0x0): | |
After scanning selected spans, do NOT read-scan remainder of disk. | |
If Selective self-test is pending on power-up, resume after 0 minute delay. | |
[dan@knew:~] $ sudo smartctl -a /dev/da7 | |
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build) | |
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org | |
=== START OF INFORMATION SECTION === | |
Model Family: Toshiba 3.5" MD04ACA... Enterprise HDD | |
Device Model: TOSHIBA MD04ACA500 | |
Serial Number: 653DK7WAFS9A | |
LU WWN Device Id: 5 000039 65bd0049b | |
Firmware Version: FP2A | |
User Capacity: 5,000,981,078,016 bytes [5.00 TB] | |
Sector Sizes: 512 bytes logical, 4096 bytes physical | |
Rotation Rate: 7200 rpm | |
Form Factor: 3.5 inches | |
Device is: In smartctl database [for details use: -P show] | |
ATA Version is: ATA8-ACS (minor revision not indicated) | |
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) | |
Local Time is: Mon Oct 29 12:38:58 2018 UTC | |
SMART support is: Available - device has SMART capability. | |
SMART support is: Enabled | |
=== START OF READ SMART DATA SECTION === | |
SMART overall-health self-assessment test result: PASSED | |
General SMART Values: | |
Offline data collection status: (0x85) Offline data collection activity | |
was aborted by an interrupting command from host. | |
Auto Offline Data Collection: Enabled. | |
Self-test execution status: ( 112) The previous self-test completed having | |
the read element of the test failed. | |
Total time to complete Offline | |
data collection: ( 120) seconds. | |
Offline data collection | |
capabilities: (0x5b) SMART execute Offline immediate. | |
Auto Offline data collection on/off support. | |
Suspend Offline collection upon new | |
command. | |
Offline surface scan supported. | |
Self-test supported. | |
No Conveyance Self-test supported. | |
Selective Self-test supported. | |
SMART capabilities: (0x0003) Saves SMART data before entering | |
power-saving mode. | |
Supports SMART auto save timer. | |
Error logging capability: (0x01) Error logging supported. | |
General Purpose Logging supported. | |
Short self-test routine | |
recommended polling time: ( 2) minutes. | |
Extended self-test routine | |
recommended polling time: ( 538) minutes. | |
SCT capabilities: (0x003d) SCT Status supported. | |
SCT Error Recovery Control supported. | |
SCT Feature Control supported. | |
SCT Data Table supported. | |
SMART Attributes Data Structure revision number: 16 | |
Vendor Specific SMART Attributes with Thresholds: | |
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE | |
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 | |
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 | |
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 9263 | |
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 59 | |
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 | |
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 | |
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 | |
9 Power_On_Hours 0x0032 043 043 000 Old_age Always - 23192 | |
10 Spin_Retry_Count 0x0033 101 100 030 Pre-fail Always - 0 | |
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59 | |
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 36 | |
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54 | |
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 458 | |
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 18/52) | |
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 | |
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 64 | |
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 8 | |
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0 | |
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0 | |
222 Loaded_Hours 0x0032 043 043 000 Old_age Always - 23060 | |
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0 | |
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0 | |
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 207 | |
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0 | |
SMART Error Log Version: 1 | |
ATA Error Count: 14 (device log contains only the most recent five errors) | |
CR = Command Register [HEX] | |
FR = Features Register [HEX] | |
SC = Sector Count Register [HEX] | |
SN = Sector Number Register [HEX] | |
CL = Cylinder Low Register [HEX] | |
CH = Cylinder High Register [HEX] | |
DH = Device/Head Register [HEX] | |
DC = Device Command Register [HEX] | |
ER = Error register [HEX] | |
ST = Status register [HEX] | |
Powered_Up_Time is measured from power on, and printed as | |
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, | |
SS=sec, and sss=millisec. It "wraps" after 49.710 days. | |
Error 14 occurred at disk power-on lifetime: 20163 hours (840 days + 3 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 08 08 93 9e 40 Error: UNC at LBA = 0x009e9308 = 10392328 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 00 00 28 93 9e 40 00 7d+06:21:40.730 READ FPDMA QUEUED | |
60 00 08 28 92 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED | |
60 00 00 28 91 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED | |
60 00 08 28 90 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED | |
60 00 00 28 8f 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED | |
Error 13 occurred at disk power-on lifetime: 20162 hours (840 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 08 f8 4c 9b 40 Error: UNC at LBA = 0x009b4cf8 = 10177784 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 68 00 a8 52 9b 40 00 7d+05:43:57.481 READ FPDMA QUEUED | |
60 c8 08 b0 4c 9b 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 58 00 88 b8 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 c0 08 c8 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
60 c8 00 00 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED | |
Error 12 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 20 40 9b 40 Error: UNC at LBA = 0x009b4020 = 10174496 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 10 20 38 52 19 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 10 18 38 50 19 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 10 10 38 02 00 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 50 08 f0 65 9b 40 00 05:34:34.941 READ FPDMA QUEUED | |
60 80 00 20 40 9b 40 00 05:34:34.941 READ FPDMA QUEUED | |
Error 11 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 e0 3f 9b 40 Error: UNC at LBA = 0x009b3fe0 = 10174432 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
60 80 08 20 40 9b 40 00 05:34:30.719 READ FPDMA QUEUED | |
60 00 00 20 3f 9b 40 00 05:34:30.719 READ FPDMA QUEUED | |
60 98 00 38 1f 9b 40 00 05:34:30.714 READ FPDMA QUEUED | |
60 00 08 38 1e 9b 40 00 05:34:30.714 READ FPDMA QUEUED | |
60 00 00 20 b2 9a 40 00 05:34:30.714 READ FPDMA QUEUED | |
Error 10 occurred at disk power-on lifetime: 19940 hours (830 days + 20 hours) | |
When the command that caused the error occurred, the device was active or idle. | |
After command completion occurred, registers were: | |
ER ST SC SN CL CH DH | |
-- -- -- -- -- -- -- | |
40 41 00 d0 26 9b 40 Error: WP at LBA = 0x009b26d0 = 10168016 | |
Commands leading to the command that caused the error were: | |
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name | |
-- -- -- -- -- -- -- -- ---------------- -------------------- | |
61 08 20 38 a4 ae 40 00 47d+16:04:36.001 WRITE FPDMA QUEUED | |
60 10 18 38 52 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 10 10 38 50 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 10 08 38 02 00 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
60 20 00 c8 26 9b 40 00 47d+16:04:33.223 READ FPDMA QUEUED | |
SMART Self-test log structure revision number 1 | |
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error | |
# 1 Selective offline Completed: read failure 00% 23191 94063856 | |
# 2 Selective offline Completed: read failure 00% 23191 94063856 | |
# 3 Extended offline Completed: read failure 00% 23183 94063856 | |
# 4 Short offline Completed without error 00% 23173 - | |
# 5 Extended offline Interrupted (host reset) 90% 23104 - | |
# 6 Short offline Completed without error 00% 23104 - | |
# 7 Extended offline Completed without error 00% 13865 - | |
# 8 Short offline Completed without error 00% 13857 - | |
SMART Selective self-test log data structure revision number 1 | |
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS | |
1 94063850 94063866 Not_testing | |
2 0 0 Not_testing | |
3 0 0 Not_testing | |
4 0 0 Not_testing | |
5 0 0 Not_testing | |
Selective self-test flags (0x0): | |
After scanning selected spans, do NOT read-scan remainder of disk. | |
If Selective self-test is pending on power-up, resume after 0 minute delay. | |
[dan@knew:~] $ |
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[dan@knew:~] $ gpart show da7 | |
=> 34 9767541101 da7 GPT (4.5T) | |
34 6 - free - (3.0K) | |
40 9766000000 1 freebsd-zfs (4.5T) | |
9766000040 1541095 - free - (752M) | |
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I removed these two drives from smartd.conf: