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scheduling daily short and monthly long tests via smartd.conf
# DEVICESCAN
/dev/da0 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da1 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da2 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da3 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da4 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da5 -a -d scsi -m dan@langille.org -s S/../.././22
/dev/da0 -a -d scsi -m dan@langille.org -s L/../28/./23
/dev/da1 -a -d scsi -m dan@langille.org -s L/../01/./01
/dev/da2 -a -d scsi -m dan@langille.org -s L/../02/./01
/dev/da3 -a -d scsi -m dan@langille.org -s L/../03/./01
/dev/da4 -a -d scsi -m dan@langille.org -s L/../04/./01
/dev/da5 -a -d scsi -m dan@langille.org -s L/../04/./01
[dan@r710-01:/var/log] $ sudo smartd -q showtests
smartd 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
Opened configuration file /usr/local/etc/smartd.conf
Configuration file /usr/local/etc/smartd.conf parsed.
Device: /dev/da0, opened
Device: /dev/da0, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628fc2, S/N: S3PTNF0JA70588A, 500 GB
Device: /dev/da0, is SMART capable. Adding to "monitor" list.
Device: /dev/da1, opened
Device: /dev/da1, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d425340fc, S/N: S3PTNF0JA11513Y, 500 GB
Device: /dev/da1, is SMART capable. Adding to "monitor" list.
Device: /dev/da2, opened
Device: /dev/da2, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d426290fc, S/N: S3PTNF0JA70742A, 500 GB
Device: /dev/da2, is SMART capable. Adding to "monitor" list.
Device: /dev/da3, opened
Device: /dev/da3, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628bea, S/N: S3PTNF0JA70159T, 500 GB
Device: /dev/da3, is SMART capable. Adding to "monitor" list.
Device: /dev/da4, opened
Device: /dev/da4, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a37e497a7, S/N: 133887400871, 32.0 GB
Device: /dev/da4, does not support SMART Self-Test Log.
Device: /dev/da4, is SMART capable. Adding to "monitor" list.
Device: /dev/da5, opened
Device: /dev/da5, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a44f24963, S/N: 134106402147, 32.0 GB
Device: /dev/da5, does not support SMART Self-Test Log.
Device: /dev/da5, is SMART capable. Adding to "monitor" list.
Device: /dev/da0, opened
Device: /dev/da0, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628fc2, S/N: S3PTNF0JA70588A, 500 GB
Device: /dev/da0, is SMART capable. Adding to "monitor" list.
Device: /dev/da1, opened
Device: /dev/da1, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d425340fc, S/N: S3PTNF0JA11513Y, 500 GB
Device: /dev/da1, is SMART capable. Adding to "monitor" list.
Device: /dev/da2, opened
Device: /dev/da2, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d426290fc, S/N: S3PTNF0JA70742A, 500 GB
Device: /dev/da2, is SMART capable. Adding to "monitor" list.
Device: /dev/da3, opened
Device: /dev/da3, [ATA Samsung SSD 850 3B6Q], lu id: 0x5002538d42628bea, S/N: S3PTNF0JA70159T, 500 GB
Device: /dev/da3, is SMART capable. Adding to "monitor" list.
Device: /dev/da4, opened
Device: /dev/da4, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a37e497a7, S/N: 133887400871, 32.0 GB
Device: /dev/da4, does not support SMART Self-Test Log.
Device: /dev/da4, is SMART capable. Adding to "monitor" list.
Device: /dev/da5, opened
Device: /dev/da5, [ATA SanDisk SDSSDRC0 0 ], lu id: 0x5001b44a44f24963, S/N: 134106402147, 32.0 GB
Device: /dev/da5, does not support SMART Self-Test Log.
Device: /dev/da5, is SMART capable. Adding to "monitor" list.
Monitoring 0 ATA/SATA, 12 SCSI/SAS and 0 NVMe devices
Next scheduled self tests (at most 5 of each type per device):
Device: /dev/da0, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da1, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da2, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da3, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da4, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da5, will do test 1 of type S at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da0, will do test 1 of type L at Sun Oct 28 23:27:36 2018 UTC
Device: /dev/da0, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da1, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da2, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da3, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da4, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da5, will do test 2 of type S at Mon Oct 29 22:27:36 2018 UTC
Device: /dev/da0, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da1, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da2, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da3, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da4, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da5, will do test 3 of type S at Tue Oct 30 22:27:36 2018 UTC
Device: /dev/da0, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da1, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da2, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da3, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da4, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da5, will do test 4 of type S at Wed Oct 31 22:27:36 2018 UTC
Device: /dev/da1, will do test 1 of type L at Thu Nov 1 01:27:36 2018 UTC
Device: /dev/da0, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da1, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da2, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da3, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da4, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da5, will do test 5 of type S at Thu Nov 1 22:27:36 2018 UTC
Device: /dev/da2, will do test 1 of type L at Fri Nov 2 01:27:36 2018 UTC
Device: /dev/da3, will do test 1 of type L at Sat Nov 3 01:27:36 2018 UTC
Device: /dev/da4, will do test 1 of type L at Sun Nov 4 01:27:36 2018 UTC
Device: /dev/da5, will do test 1 of type L at Sun Nov 4 01:27:36 2018 UTC
Device: /dev/da0, will do test 2 of type L at Wed Nov 28 23:27:36 2018 UTC
Device: /dev/da1, will do test 2 of type L at Sat Dec 1 01:27:36 2018 UTC
Device: /dev/da2, will do test 2 of type L at Sun Dec 2 01:27:36 2018 UTC
Device: /dev/da3, will do test 2 of type L at Mon Dec 3 01:27:36 2018 UTC
Device: /dev/da4, will do test 2 of type L at Tue Dec 4 01:27:36 2018 UTC
Device: /dev/da5, will do test 2 of type L at Tue Dec 4 01:27:36 2018 UTC
Device: /dev/da0, will do test 3 of type L at Fri Dec 28 23:27:36 2018 UTC
Device: /dev/da1, will do test 3 of type L at Tue Jan 1 01:27:36 2019 UTC
Device: /dev/da2, will do test 3 of type L at Wed Jan 2 01:27:36 2019 UTC
Device: /dev/da3, will do test 3 of type L at Thu Jan 3 01:27:36 2019 UTC
Device: /dev/da4, will do test 3 of type L at Fri Jan 4 01:27:36 2019 UTC
Device: /dev/da5, will do test 3 of type L at Fri Jan 4 01:27:36 2019 UTC
Totals [Sun Oct 28 22:57:36 2018 UTC - Sat Jan 26 22:57:36 2019 UTC]:
Device: /dev/da0, will do 0 tests of type L
Device: /dev/da0, will do 91 tests of type S
Device: /dev/da1, will do 0 tests of type L
Device: /dev/da1, will do 91 tests of type S
Device: /dev/da2, will do 0 tests of type L
Device: /dev/da2, will do 91 tests of type S
Device: /dev/da3, will do 0 tests of type L
Device: /dev/da3, will do 91 tests of type S
Device: /dev/da4, will do 0 tests of type L
Device: /dev/da4, will do 91 tests of type S
Device: /dev/da5, will do 0 tests of type L
Device: /dev/da5, will do 91 tests of type S
Device: /dev/da0, will do 3 tests of type L
Device: /dev/da0, will do 0 tests of type S
Device: /dev/da1, will do 3 tests of type L
Device: /dev/da1, will do 0 tests of type S
Device: /dev/da2, will do 3 tests of type L
Device: /dev/da2, will do 0 tests of type S
Device: /dev/da3, will do 3 tests of type L
Device: /dev/da3, will do 0 tests of type S
Device: /dev/da4, will do 3 tests of type L
Device: /dev/da4, will do 0 tests of type S
Device: /dev/da5, will do 3 tests of type L
Device: /dev/da5, will do 0 tests of type S
[dan@r710-01:/var/log] $
[dan@knew:~] $ cat /var/log/messages
Oct 29 00:00:00 knew newsyslog[4405]: logfile turned over
Oct 29 00:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 00:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 01:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 01:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 02:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 02:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 03:22:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 03:52:59 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], 8 Offline uncorrectable sectors
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], previous self-test completed with error (read test element)
Oct 29 04:22:58 knew smartd[1068]: Device: /dev/da7 [SAT], Self-Test Log error count increased from 0 to 1
Oct 29 04:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 64 Currently unreadable (pending) sectors
Oct 29 04:52:58 knew smartd[1068]: Device: /dev/da7 [SAT], 8 Offline uncorrectable sectors
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 00% 23183 94063856
# 2 Short offline Completed without error 00% 23173 -
# 3 Extended offline Interrupted (host reset) 90% 23104 -
# 4 Short offline Completed without error 00% 23104 -
# 5 Extended offline Completed without error 00% 13865 -
# 6 Short offline Completed without error 00% 13857 -
# start where we failed (see line 3 in previous section
sudo smartctl -t select,94063856-94063866 /dev/da7
# start a few spots earlier:
sudo smartctl -t select,94063850-94063866 /dev/da7
[dan@knew:~] $ sudo smartctl -a /dev/da7
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" MD04ACA... Enterprise HDD
Device Model: TOSHIBA MD04ACA500
Serial Number: 653DK7WAFS9A
LU WWN Device Id: 5 000039 65bd0049b
Firmware Version: FP2A
User Capacity: 5,000,981,078,016 bytes [5.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Oct 29 12:36:47 2018 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 249) Self-test routine in progress...
90% of test remaining.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 538) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 9263
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 59
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 043 043 000 Old_age Always - 23191
10 Spin_Retry_Count 0x0033 101 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 36
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 458
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 18/52)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 64
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 8
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
222 Loaded_Hours 0x0032 043 043 000 Old_age Always - 23060
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 207
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 20163 hours (840 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 08 08 93 9e 40 Error: UNC at LBA = 0x009e9308 = 10392328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 28 93 9e 40 00 7d+06:21:40.730 READ FPDMA QUEUED
60 00 08 28 92 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED
60 00 00 28 91 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED
60 00 08 28 90 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED
60 00 00 28 8f 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED
Error 13 occurred at disk power-on lifetime: 20162 hours (840 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 08 f8 4c 9b 40 Error: UNC at LBA = 0x009b4cf8 = 10177784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 68 00 a8 52 9b 40 00 7d+05:43:57.481 READ FPDMA QUEUED
60 c8 08 b0 4c 9b 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 58 00 88 b8 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 c0 08 c8 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 c8 00 00 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
Error 12 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 20 40 9b 40 Error: UNC at LBA = 0x009b4020 = 10174496
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 10 20 38 52 19 40 00 05:34:34.941 READ FPDMA QUEUED
60 10 18 38 50 19 40 00 05:34:34.941 READ FPDMA QUEUED
60 10 10 38 02 00 40 00 05:34:34.941 READ FPDMA QUEUED
60 50 08 f0 65 9b 40 00 05:34:34.941 READ FPDMA QUEUED
60 80 00 20 40 9b 40 00 05:34:34.941 READ FPDMA QUEUED
Error 11 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 e0 3f 9b 40 Error: UNC at LBA = 0x009b3fe0 = 10174432
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 08 20 40 9b 40 00 05:34:30.719 READ FPDMA QUEUED
60 00 00 20 3f 9b 40 00 05:34:30.719 READ FPDMA QUEUED
60 98 00 38 1f 9b 40 00 05:34:30.714 READ FPDMA QUEUED
60 00 08 38 1e 9b 40 00 05:34:30.714 READ FPDMA QUEUED
60 00 00 20 b2 9a 40 00 05:34:30.714 READ FPDMA QUEUED
Error 10 occurred at disk power-on lifetime: 19940 hours (830 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 d0 26 9b 40 Error: WP at LBA = 0x009b26d0 = 10168016
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 20 38 a4 ae 40 00 47d+16:04:36.001 WRITE FPDMA QUEUED
60 10 18 38 52 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 10 10 38 50 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 10 08 38 02 00 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 20 00 c8 26 9b 40 00 47d+16:04:33.223 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Selective offline Completed: read failure 00% 23191 94063856
# 2 Extended offline Completed: read failure 00% 23183 94063856
# 3 Short offline Completed without error 00% 23173 -
# 4 Extended offline Interrupted (host reset) 90% 23104 -
# 5 Short offline Completed without error 00% 23104 -
# 6 Extended offline Completed without error 00% 13865 -
# 7 Short offline Completed without error 00% 13857 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 94063850 94063866 Self_test_in_progress [90% left] (94044160-94109695)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[dan@knew:~] $ sudo smartctl -a /dev/da7
smartctl 6.6 2017-11-05 r4594 [FreeBSD 11.2-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" MD04ACA... Enterprise HDD
Device Model: TOSHIBA MD04ACA500
Serial Number: 653DK7WAFS9A
LU WWN Device Id: 5 000039 65bd0049b
Firmware Version: FP2A
User Capacity: 5,000,981,078,016 bytes [5.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Oct 29 12:38:58 2018 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 112) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 538) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 9263
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 59
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 043 043 000 Old_age Always - 23192
10 Spin_Retry_Count 0x0033 101 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 59
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 36
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 458
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 18/52)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 64
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 8
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
222 Loaded_Hours 0x0032 043 043 000 Old_age Always - 23060
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 207
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 14 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 14 occurred at disk power-on lifetime: 20163 hours (840 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 08 08 93 9e 40 Error: UNC at LBA = 0x009e9308 = 10392328
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 00 28 93 9e 40 00 7d+06:21:40.730 READ FPDMA QUEUED
60 00 08 28 92 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED
60 00 00 28 91 9e 40 00 7d+06:21:40.729 READ FPDMA QUEUED
60 00 08 28 90 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED
60 00 00 28 8f 9e 40 00 7d+06:21:40.728 READ FPDMA QUEUED
Error 13 occurred at disk power-on lifetime: 20162 hours (840 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 08 f8 4c 9b 40 Error: UNC at LBA = 0x009b4cf8 = 10177784
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 68 00 a8 52 9b 40 00 7d+05:43:57.481 READ FPDMA QUEUED
60 c8 08 b0 4c 9b 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 58 00 88 b8 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 c0 08 c8 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
60 c8 00 00 b7 f9 40 00 7d+05:43:57.480 READ FPDMA QUEUED
Error 12 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 20 40 9b 40 Error: UNC at LBA = 0x009b4020 = 10174496
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 10 20 38 52 19 40 00 05:34:34.941 READ FPDMA QUEUED
60 10 18 38 50 19 40 00 05:34:34.941 READ FPDMA QUEUED
60 10 10 38 02 00 40 00 05:34:34.941 READ FPDMA QUEUED
60 50 08 f0 65 9b 40 00 05:34:34.941 READ FPDMA QUEUED
60 80 00 20 40 9b 40 00 05:34:34.941 READ FPDMA QUEUED
Error 11 occurred at disk power-on lifetime: 19994 hours (833 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 e0 3f 9b 40 Error: UNC at LBA = 0x009b3fe0 = 10174432
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 80 08 20 40 9b 40 00 05:34:30.719 READ FPDMA QUEUED
60 00 00 20 3f 9b 40 00 05:34:30.719 READ FPDMA QUEUED
60 98 00 38 1f 9b 40 00 05:34:30.714 READ FPDMA QUEUED
60 00 08 38 1e 9b 40 00 05:34:30.714 READ FPDMA QUEUED
60 00 00 20 b2 9a 40 00 05:34:30.714 READ FPDMA QUEUED
Error 10 occurred at disk power-on lifetime: 19940 hours (830 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 00 d0 26 9b 40 Error: WP at LBA = 0x009b26d0 = 10168016
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 20 38 a4 ae 40 00 47d+16:04:36.001 WRITE FPDMA QUEUED
60 10 18 38 52 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 10 10 38 50 19 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 10 08 38 02 00 40 00 47d+16:04:33.223 READ FPDMA QUEUED
60 20 00 c8 26 9b 40 00 47d+16:04:33.223 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Selective offline Completed: read failure 00% 23191 94063856
# 2 Selective offline Completed: read failure 00% 23191 94063856
# 3 Extended offline Completed: read failure 00% 23183 94063856
# 4 Short offline Completed without error 00% 23173 -
# 5 Extended offline Interrupted (host reset) 90% 23104 -
# 6 Short offline Completed without error 00% 23104 -
# 7 Extended offline Completed without error 00% 13865 -
# 8 Short offline Completed without error 00% 13857 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 94063850 94063866 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[dan@knew:~] $
[dan@knew:~] $ gpart show da7
=> 34 9767541101 da7 GPT (4.5T)
34 6 - free - (3.0K)
40 9766000000 1 freebsd-zfs (4.5T)
9766000040 1541095 - free - (752M)
@dlangille
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dlangille commented Oct 28, 2018

I removed these two drives from smartd.conf:

Oct 28 23:22:37 r710-01 smartd[83996]: Device: /dev/da4, does not support Self-Tests
Oct 28 23:22:37 r710-01 smartd[83996]: Device: /dev/da5, does not support Self-Tests

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