Skip to content

Instantly share code, notes, and snippets.

@Kazu-zamasu
Created December 30, 2015 13:18
Show Gist options
  • Save Kazu-zamasu/85b227c45e242182ee4d to your computer and use it in GitHub Desktop.
Save Kazu-zamasu/85b227c45e242182ee4d to your computer and use it in GitHub Desktop.
Kazu-iMac-Develop@Debug:22:08:01:~$/usr/local/sbin/smartctl -a /dev/disk0
smartctl 6.4 2015-06-04 r4109 [x86_64-apple-darwin13.4.0] (local build)
Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: APPLE HDD WD10EZES-40UFAA0
Serial Number: WD-WCC1S8140421
LU WWN Device Id: 5 0014ee 25f07bb83
Firmware Version: 12.13D03
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Wed Dec 30 22:08:20 2015 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status command failed: Undefined error: 0
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (10320) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 119) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0xb0b5) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 1729
3 Spin_Up_Time 0x0027 175 173 021 Pre-fail Always - 2250
4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 5055
5 Reallocated_Sector_Ct 0x0033 137 137 140 Pre-fail Always FAILING_NOW 2578
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 50
9 Power_On_Hours 0x0032 089 089 000 Old_age Always - 8069
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 095 095 000 Old_age Always - 5055
192 Power-Off_Retract_Count 0x0032 194 194 000 Old_age Always - 4949
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 105
194 Temperature_Celsius 0x0022 105 085 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x0036 200 200 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 001 001 000 Old_age Always - 280
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 4
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 4
SMART Error Log Version: 1
ATA Error Count: 6 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 6 occurred at disk power-on lifetime: 8068 hours (336 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 4c 4e 55 0f
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
e1 44 00 4c 4e 55 0f 00 2d+06:57:38.360 IDLE IMMEDIATE
Error 5 occurred at disk power-on lifetime: 8026 hours (334 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 03 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 03 00 00 00 00 00 12:52:12.893 SET FEATURES [Enable SATA feature]
ef 10 02 00 00 00 00 00 12:52:12.893 SET FEATURES [Enable SATA feature]
ef 02 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 12:52:12.892 SET FEATURES [Set transfer mode]
Error 4 occurred at disk power-on lifetime: 8026 hours (334 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 02 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 10 02 00 00 00 00 00 12:52:12.893 SET FEATURES [Enable SATA feature]
ef 02 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 12:52:12.892 SET FEATURES [Set transfer mode]
Error 3 occurred at disk power-on lifetime: 8026 hours (334 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable write cache]
ef aa 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 12:52:12.892 SET FEATURES [Set transfer mode]
Error 2 occurred at disk power-on lifetime: 8026 hours (334 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef aa 00 00 00 00 00 00 12:52:12.892 SET FEATURES [Enable read look-ahead]
ef 03 46 00 00 00 00 00 12:52:12.892 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Kazu-iMac-Develop@Debug:22:08:20:~$
Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment