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Connected to /dev/ttyACM1 | |
================================================================================ | |
Name: init test | |
Description: Tests the initialization of the i2c periph | |
Result: PASS | |
Notes: | |
-------------------------------------------------------------------------------- | |
Command: | |
Message: Amount of i2c devices: [1] | |
Data: [1] |
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Starting puf_sram Test at 2018-06-11-09-54-41 | |
Number of samples = 500 | |
Off Time = 1(s) | |
Board = nulceo-f401re | |
Ram Allocation = 1024 | |
Iteration 0/500 | |
2034504834 | |
Iteration 1/500 | |
1148096758 | |
Iteration 2/500 |
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#!/usr/bin/env python3 | |
# Copyright (C) 2018 Kevin Weiss <kevin.weiss@haw-hamburg.de> | |
# Copyright (C) 2018 Peter Kietzmann <peter.kietzmann@haw-hamburg.de> | |
# | |
# This file is subject to the terms and conditions of the GNU Lesser | |
# General Public License v2.1. See the file LICENSE in the top level | |
# directory for more details. | |
import puf_sram_if |
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Starting Test periph_i2c | |
================================================================================ | |
Name: init test | |
Desc: Tests the initialization of the i2c periph | |
Result: PASS | |
Notes: | |
-------------------------------------------------------------------------------- | |
Command: | |
Message: Amount of i2c devices: [1] | |
Data: [1] |
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Starting Test periph_i2c | |
================================================================================ | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: PASS | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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Starting Test periph_i2c | |
================================================================================ | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: PASS | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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Starting Test periph_i2c | |
================================================================== | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: PASS | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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Starting Test periph_i2c | |
================================================================== | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: PASS | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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Starting Test periph_i2c | |
================================================================== | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: PASS | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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Starting Test periph_i2c | |
================================================================== | |
Name: mutex test | |
Desc: Tests mutex aquire/release functionality | |
Result: WARN | |
Notes: Cannot test since it can still be used without mutex | |
Cannot test expected timeout due to no reset | |
Do we need double release failure check? | |
Does not check multiple busses acquired |
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