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Smartctl data for SO question
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-35-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
/dev/sda [cciss_disk_00] [SAT]: Device open changed type from 'sat,auto+cciss' to 'sat'
=== START OF INFORMATION SECTION ===
Device Model: PLEXTOR PX-256M5Pro
Serial Number: ************
LU WWN Device Id: ************
Add. Product Id: DC802080
Firmware Version: 1.05
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 4a
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Dec 10 11:34:05 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART STATUS RETURN: incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 10) seconds.
Offline data collection
capabilities: (0x15) SMART execute Offline immediate.
No Auto Offline data collection support.
Abort Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0002) Does not save SMART data before
entering power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x00) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 10) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x0003 100 100 070 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0003 100 100 000 Pre-fail Always - 0
9 Power_On_Hours 0x0002 100 100 000 Old_age Always - 325
12 Power_Cycle_Count 0x0002 100 100 000 Old_age Always - 16
177 Wear_Leveling_Count 0x0003 100 100 000 Pre-fail Always - 131812
178 Used_Rsvd_Blk_Cnt_Chip 0x0003 100 100 000 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0003 100 100 000 Pre-fail Always - 0
182 Erase_Fail_Count_Total 0x0003 100 100 000 Pre-fail Always - 0
187 Reported_Uncorrect 0x0002 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0003 100 100 000 Pre-fail Always - 18
196 Reallocated_Event_Count 0x0003 100 100 000 Pre-fail Always - 0
198 Offline_Uncorrectable 0x0003 100 100 000 Pre-fail Always - 0
199 UDMA_CRC_Error_Count 0x0003 100 100 000 Pre-fail Always - 0
232 Available_Reservd_Space 0x0003 100 100 010 Pre-fail Always - 0
241 Total_LBAs_Written 0x0003 100 100 000 Pre-fail Always - 164658
242 Total_LBAs_Read 0x0003 100 100 000 Pre-fail Always - 124849
SMART Error Log Version: 0
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 17409 -
Selective Self-tests/Logging not supported
Device Statistics (GP Log 0x04) not supported
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-35-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
/dev/sda [cciss_disk_01] [SAT]: Device open changed type from 'sat,auto+cciss' to 'sat'
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 840 PRO Series
Serial Number: *************
LU WWN Device Id: *************
Firmware Version: DXM06B0Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Dec 10 11:34:00 2014 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART STATUS RETURN: incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (53956) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 20) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 2059
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 14
177 Wear_Leveling_Count 0x0013 094 094 000 Pre-fail Always - 201
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 077 068 000 Old_age Always - 23
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 13
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 11202208305
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Device Statistics (GP Log 0x04) not supported
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