SMART_status_ssd.txt

smartctl 6.5 2016-05-07 r4318 [Darwin 16.7.0 x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Apple SD/SM/TS...E/F SSDs
Device Model:     APPLE SSD SM0256F
Serial Number:    S1KXXXXXXXX240
LU WWN Device Id: 5 002538 655584d30
Firmware Version: UXM2JA1Q
User Capacity:    251,000,193,024 bytes [251 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    Solid State Device
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 4c
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sat Jul 29 11:51:56 2017 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(    0) seconds.
Offline data collection
capabilities: 			 (0x5f) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Abort Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  10) minutes.

SMART Attributes Data Structure revision number: 40
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x001a   200   200   000    Old_age   Always       -       0
  5 Reallocated_Sector_Ct   0x0033   100   100   000    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   096   096   000    Old_age   Always       -       15984
 12 Power_Cycle_Count       0x0032   089   089   000    Old_age   Always       -       10741
169 Unknown_Attribute       0x0013   253   253   010    Pre-fail  Always       -       1988913794816
173 Wear_Leveling_Count     0x0032   184   184   100    Old_age   Always       -       816076030293
174 Host_Reads_MiB          0x0022   099   099   000    Old_age   Always       -       34341760
175 Host_Writes_MiB         0x0022   099   099   000    Old_age   Always       -       31290607
192 Power-Off_Retract_Count 0x0012   099   099   000    Old_age   Always       -       151
194 Temperature_Celsius     0x0022   056   056   000    Old_age   Always       -       44 (Min/Max 12/65)
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x001a   200   200   000    Old_age   Always       -       0
240 Unknown_SSD_Attribute   0x0022   100   100   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%         4         -
# 2  Extended offline    Completed without error       00%         3         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.