Thin Film Measurement Proof of Concept

ThinFilmMeasurement.cs

using System;
using System.Collections.Generic;
using System.IO;
using System.Linq;
using System.Runtime.Remoting.Messaging;
using System.Windows.Forms;
using OxyPlot;
using OxyPlot.Series;

namespace GraphingTests
{
    public partial class Form1 : Form
    {
        public Form1()
        {
            InitializeComponent();
        }

        public class ElementData
        {
            public int Wavelength { get; set; }
            public double IndexOfRefraction { get; set; }
        }

        public class Spectrum
        {
            public double Wavelength { get; set; }
            public double Reflectance { get; set; }
        }

        private List<ElementData> _sio2Data;
        private PlotModel _model;
        private LineSeries _lineSeries;

        private void Form1_Load(object sender, EventArgs e)
        {
            var spectrum = File.ReadAllLines(@"D:\Documents\Projects\Semiconductor Processing\Reflectance Spectrums\0-15.txt")
                .Skip(14).Where(x => !string.IsNullOrEmpty(x))
                .Select(x => x.Split('\t')).Where(x => !x[1].Contains("-")).Select(x => new Spectrum
                {
                    Wavelength = double.Parse(x[0]),
                    Reflectance = Math.Min(double.Parse(x[1]), 120)
                }).ToList();
            var min = spectrum.Min(x => x.Wavelength);
            var max = spectrum.Max(x => x.Wavelength);
            _sio2Data = File.ReadAllLines(@"D:\Documents\Projects\Semiconductor Processing\SiO2.txt")
                .Skip(1).Where(x => !string.IsNullOrEmpty(x))
                .Select(x => x.Split('\t')).Select(x => new ElementData
                {
                    Wavelength = int.Parse(x[0]),
                    IndexOfRefraction = double.Parse(x[1])
                }).Where(x => x.Wavelength > min && x.Wavelength < max).ToList();

            _model = new PlotModel { Title = "Example 1" };
            var series = new LineSeries();
            spectrum.ForEach(x => series.Points.Add(new DataPoint(x.Wavelength, x.Reflectance)));
            _model.Series.Add(series);
            Recalc();
            plot1.Model = _model;
        }

        // 79.9 nm
        private double CallContext(int wavelength, double indexOfRefraction)
        {
            var offset = (double)Offset.Value; // A
            var amplitude = (double)Amplitude.Value; // B
            var depth = (double)Thickness.Value;
            var result = offset + amplitude * Math.Cos((2 * Math.PI * indexOfRefraction * depth) / wavelength);
            return result;
        }

        public void Recalc()
        {
            if (_model.Series.Contains(_lineSeries)) _model.Series.Remove(_lineSeries);
            _lineSeries = new LineSeries();
            _sio2Data.ForEach(x => _lineSeries.Points.Add(new DataPoint(x.Wavelength, CallContext(x.Wavelength, x.IndexOfRefraction))));
            _model.Series.Add(_lineSeries);

            _model.InvalidatePlot(true);
        }

        private void Offset_ValueChanged(object sender, EventArgs e)
        {
            Recalc();
        }

        private void Amplitude_ValueChanged(object sender, EventArgs e)
        {
            Recalc();
        }

        private void Thickness_ValueChanged(object sender, EventArgs e)
        {
            Recalc();
        }
    }
}